SYMPOSIA PAPER Published: 01 January 1988
STP26189S

Galvanic Corrosion Caused by Corrosion Products

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Experiments were conducted to quantify the magnitude of galvanic currents and potentials that exist between metals (iron, copper, titanium, aluminum, chromium, and nickel) and their corrosion products in oxygen-containing environments. Current measurements using a zero resistance ammeter and potential measurements of metal electrodes and oxide electrodes are reported. The effects of solution and electrode compositions on galvanic currents and potentials were determined. A galvanic series of corrosion products was constructed.

Galvanic interactions between metals and surface compounds are dependent on electronic conduction type (insulator, n-type, p-type, metallic) and thickness of corrosion product layers. It may be possible to modify semiconductor film conductivity by doping with impurity elements present as alloy constituents or via environmental addition and thereby mitigate galvanic corrosion.

Author Information

Wilhelm, SM
Cortest Laboratories, Inc., Cypress, TX
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Details
Developed by Committee: G01
Pages: 23–34
DOI: 10.1520/STP26189S
ISBN-EB: 978-0-8031-5049-2
ISBN-13: 978-0-8031-0981-0