| ||Format||Pages||Price|| |
|PDF (348K)||17||$25||  ADD TO CART|
|Complete Source PDF (1.8M)||113||$55||  ADD TO CART|
The goal of analytical statistical process control (ASPC) is to reduce process variability, which in turn will improve the quality of our products. In the case of laboratories, the products are analyses. The analyses, in turn, are used for process control and to verify that products meet customer specifications.
ASPC is implemented through use of control charts, which require a modest understanding of statistics. This paper briefly describes the practical side of developing and interpreting control charts. It also includes a discussion on what is needed to automatically maintain and interpret control charts for use with multi-element analyzers, such as optical emission (OE), X-ray fluoresence (XRF), and plasma spectrometers.
statistics, variability, process control, X-ray spectrometers, optical emission spectrometers, control charts, automation, control limits, interpretation
Consultant, Applied Research Labs, Coopersburg, PA