You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.

    If you are an ASTM Compass Subscriber and this document is part of your subscription, you can access it for free at ASTM Compass

    Growth of Small Cracks and an Evaluation of Low Cycle Fatigue Life

    Published: 01 January 1988

      Format Pages Price  
    PDF (464K) 24 $25   ADD TO CART
    Complete Source PDF (27M) 1279 $271   ADD TO CART

    Cite this document

    X Add email address send
      .RIS For RefWorks, EndNote, ProCite, Reference Manager, Zoteo, and many others.   .DOCX For Microsoft Word


    Smooth and through-thickness cracked specimens of JIS S35C medium carbon and SNCM 439 alloy steels, heat-treated in several conditions, were low cycle fatigued. The growth rates of small surface and through-thickness large cracks, da/dN, were analyzed in terms of the cyclic J-integral range, ΔJ, and the strain intensity factor range, ΔKϵ.

    The crack growth rates plotted against ΔJ and ΔKϵ are expressed by straight lines on a log-log diagram. The fairly large scatter inherent in a small crack problem hides some difference in the relations of da/dN versus ΔJ and the da/dN versus ΔKϵ plots between different materials. These relations in a small surface crack are slightly different from those in the through-thickness large crack.

    The equations derived from combining these two relations and the cyclic stress-strain curve express well the fatigue life curves, of which slopes decrease in the lower plastic strain range in materials having a high strength and a low ductility, as well as the usual Coffin-Manson plot.


    metallic materials, low cycle fatigue, crack growth, small surface crack, through-thickness large crack, cyclic , J, -integral, strain intensity factor, cyclic stress-strain curve, Coffin-Manson law, life prediction

    Author Information:

    Hatanaka, K
    Professor and Senior Research Associate, Yamaguchi University, Ube,

    Fujimitsu, T
    Professor and Senior Research Associate, Yamaguchi University, Ube,

    Committee/Subcommittee: E08.05

    DOI: 10.1520/STP24486S