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    STP1025

    Development of an Instrumented Device to Measure Fixture-induced Bending in Pin-loaded Specimen Trains

    Published: 0


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    Abstract

    Mechanical testing of various types is conducted using pinned clevis fixtures to transmit test loads to a range of specimen configurations. To ensure reliable repeatable results, fixture-induced load distribution variations must be kept to a minimum. This paper describes a simple, inexpensive, instrumented device and data analysis technique for measuring fixture-induced bending (that is, transverse nonuniformity of load application) of compact type [C(T)] specimen fixtures. Finite-element analysis was performed to illustrate the importance of uniform load distribution. The instrumented device may be used for other sizes or configurations of pin-loaded trains after consideration of appropriate dimensional modifications to the instrumented device.

    Keywords:

    bending, alignment, pinned clevis, compact specimen, stress intensity , K


    Author Information:

    Scavone, DW
    Senior specialist—Mechanics of Materials, General Electric Co., Knolls Atomic Power Laboratory, Schenectady, NY


    Committee/Subcommittee: E28.94

    DOI: 10.1520/STP24019S