You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.


    Structure and Applications of the NASA Fracture Mechanics Database

    Published: 0

      Format Pages Price  
    PDF (256K) 12 $25   ADD TO CART
    Complete Source PDF (8.8M) 497 $85   ADD TO CART

    Cite this document

    X Add email address send
      .RIS For RefWorks, EndNote, ProCite, Reference Manager, Zoteo, and many others.   .DOCX For Microsoft Word


    A computerized database of fracture mechanics properties of materials has been developed for use in fracture control analysis of NASA space hardware. This database currently consists of fatigue crack growth and fracture toughness data. To unify data access, a data set identification code was developed. The identification code contains fields representing the material, heat treatment, product form, crack orientation, and environmental atmosphere and temperature. For fatigue crack growth data, the file system is made up of a directory file, a specimen information file, and a numerical data points file. The fracture toughness data require only a directory file, and a specimen information file. This system is designed to be compatible with NASA/FLAGRO which is used to perform fracture control analysis for both the Space Transportation System payloads and Space Station Freedom. The database has already proven to be useful for providing least squares curve fits for materials included in NASA/FLAGRO. Also, studies have been conducted using the database to check the accuracy of crack case solutions, and to evaluate or develop improved crack growth models.


    fracture mechanics, fatigue crack growth, fracture toughness, material identification code, NASA/FLAGRO

    Author Information:

    Lawrence, VB
    Sr. Associate Engineer, Lockheed Engineering and Sciences Company, Houston, TX

    Forman, RG
    Sr. Materials Engineer, NASA, Lyndon B. Johnson Space Center, Houson, TX

    Committee/Subcommittee: E49.51

    DOI: 10.1520/STP23764S