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    Performance Characteristics of a Beam Profiling System Consisting of Various Solid State Imaging Devices and an 8-Bit Image Processor

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    A beam profiling system that interfaces an 8-bit image processor to either of two self-scanned solid state area array cameras is described. Results of measurements to characterize the performance of the camera sensors, a frame transfer charge coupled device (CCD) and a charge injection device (CID), are presented and discussed. The CCD camera is shown to have the advantages of simpler interfacing requirements, greater access to the image processor software, better dark current pattern noise, and wider spatial frequency bandwidth. The CID camera may have wider dynamic range and better photosensitivity pattern noise, but further measurements of these properties are warranted.


    beam profiling, charge coupled device, charge injection device, dynamic range, fixed pattern noise, modulation transfer function

    Author Information:

    O'Connell, RM
    University of Missouri-Columbia, Columbia, MO

    Stewart, AF
    University of Missouri-Columbia, Columbia, MO

    Committee/Subcommittee: E13.10

    DOI: 10.1520/STP18539S