SYMPOSIA PAPER
Published:
31 October 2019
STP161420180050
Review of the National Institute of Standards and Technology Research Program in Trace Contraband Detection
SourceCurrent national priorities in homeland security have led to an unprecedented level of utilization of explosives trace detection (ETD) systems for counterterrorism and law enforcement. Despite the widespread deployment of ETD instruments at airports, military installations, and in law enforcement applications, there remains a critical need for robust standard materials and procedures to calibrate, verify, and optimize the performance characteristics of these systems. Consensus and control of these fundamental criteria are critically important for making informed, balanced, and defendable decisions in the continual upgrades to homeland security programs. This paper reviews recent activities at the National Institute of Standards and Technology (NIST) to support these objectives.
Author Information
Gillen, Greg
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Verkouteren, Jennifer
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Najarro, Marcela
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Staymates, Matt
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Verkouteren, Mike
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Fletcher, Robert
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Muramoto, Shin
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Staymates, Jessica
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Lawrence, Jeff
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Robinson, Liz
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Sisco, Ed
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Forbes, Thomas, P.
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Bennett, Joe
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
Bulk, Alex
Surface and Trace Chemical Analysis Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, US
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Details
Developed by Committee: E54
Pages: 49–62
DOI: 10.1520/STP161420180050
ISBN-EB: 978-0-8031-7674-4
ISBN-13: 978-0-8031-7673-7