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    Intercomparison of Neutron Test Facilities for Equivalent Damage to Electronics


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    Neutron-sensitive diodes are practical monitors for comparing damage delivered to electronic devices among different test facilities. Heat treatment of the diodes before readout is shown to eliminate effects of temperature variations between exposure and readout. This allows the comparisons to be done on a mail-in basis. The results of such a comparison among several neutron facilities is presented.


    neutron damage, neutron dosimetry, 1 MeV equivalence, damage intercomparison

    Author Information:

    Heimbach, CR
    Physicist, Combat Systems Test Activity, STECS-NE, MD

    Committee/Subcommittee: E10.08

    DOI: 10.1520/STP15146S