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    MNL17-2ND

    Measurement of Film Thickness

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    Source: MNL17-2ND-EB

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    Abstract

    IN PREPARATION OF THIS CHAPTER, THE CONTENTS of the 14th edition were drawn upon. The current edition will review and update the topics, introduce new technology that has been developed, and include up-to-date references.

    Author Information:

    Fletcher, John
    Technical Support Manager, Elcometer Limited,

    Walker, Joseph
    VP Sales & Marketing, Elcometer Inc, Rochester Hills, MI

    Committee/Subcommittee: D01.23

    DOI: 10.1520/MNL12221M