You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.

    DS46

    X-Ray Emission Wavelengths and Kev Tables for Nondiffractive Analysis

    Published: Apr 1970


      Format Pages Price  
    PDF (2.8M) 41 $25   ADD TO CART


    Abstract

    Recently developed, high-resolution X-ray detectors such as lithium-drifted silicon and germanium have resulted in widespread application of nondiffractive (also called nondispersive) analysis as an alternative or complementary technique to X-ray emission spectrography (X-ray fluorescence analysis). This table has been prepared for use in nondiffractive analyses. All the X-ray emission lines shorter than 50 Å* have been tabulated in two basic arrangements. The first section of the table is a compilation of each line for each element arranged on the basis of increasing atomic number and increasing wavelength (decreasing energy) for the lines of each element. The second section of the table lists all the X-ray lines ordered on the basis of increasing wavelength (decreasing energy) regardless of element.


    Author Information:

    Johnson, G. G.

    White, E. W.


    Committee/Subcommittee: E02.02

    DOI: 10.1520/MNL11838D