You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.

    Volume 47, Issue 2 (February 2019)

    Optimal Plans of Constant-Stress Accelerated Life Tests for Extension of the Exponential Distribution

    (Received 20 October 2016; accepted 27 September 2017)

    Published Online: 09 May 2018

    CODEN: JTEVAB

      Format Pages Price  
    PDF (280.53 KB) 20 $25   ADD TO CART

    Cite this document

    X Add email address send
    X
      .RIS For RefWorks, EndNote, ProCite, Reference Manager, Zoteo, and many others.   .DOCX For Microsoft Word



    Abstract

    In this article, the optimal plans for a k-level constant-stress accelerated life test are presented for extension of the exponential failure data under complete sampling. According to the log-linear life-stress relationship, the optimal proportion of test units allocated to each stress level is determined under D- and C-optimality criteria. Moreover, a real data set is analyzed to illustrate the proposed procedures. Furthermore, the real data set is used to show that extension of the exponential (EE) distribution can be a better model than both Weibull distribution and generalized exponential distribution. In addition, numerical examples are used to illustrate the proposed procedures and to compare between the D-optimal plan and C-optimal plan through asymptotic variance of maximum likelihood estimators. Finally, some interesting conclusions are obtained.

    Author Information:

    Abd El-Raheem, A. M.
    Department of Mathematics, Faculty of Education, Ain Shams University, Cairo,


    Stock #: JTE20170227

    ISSN:0090-3973

    DOI: 10.1520/JTE20170227

    Author
    Title Optimal Plans of Constant-Stress Accelerated Life Tests for Extension of the Exponential Distribution
    Symposium ,
    Committee E11