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    Volume 44, Issue 5 (September 2016)

    Special Issue Paper

    Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data

    (Received 16 June 2015; accepted 23 November 2015)

    Published Online: 02 September 2016

    CODEN: JTEVAB

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    Abstract

    Demand for high-quality silicon wafers poses a tremendous challenge to wafer manufacturers in today's competitive environment. Among various quality-improvement activities, process capability index Cpmk is widely used in industry to measure the ability of firms or their suppliers to meet quality requirements, because measurements of product quality often cannot be precisely recorded or collected. This study uses fuzzy numbers to construct a fuzzy estimator for Cpmk. Moreover, a testing procedure and a procedure for ranking multiple processes are provided to solve the wafer-supplier-selection problem.


    Author Information:

    Wu, Chien-Wei
    Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu,

    Liao, Mou-Yuan
    Dept. of Statistics and Informatics Science, Providence Univ., Taichung,

    Lin, Chi-Wei
    Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung,

    Lin, Tzu-Ling
    Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung,


    Stock #: JTE20150262

    ISSN:0090-3973

    DOI: 10.1520/JTE20150262

    Author
    Title Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data
    Symposium ,
    Committee E11