Journal Published Online: 02 February 2016
Volume 44, Issue 5

Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data

CODEN: JTEVAB

Abstract

Demand for high-quality silicon wafers poses a tremendous challenge to wafer manufacturers in today's competitive environment. Among various quality-improvement activities, process capability index Cpmk is widely used in industry to measure the ability of firms or their suppliers to meet quality requirements, because measurements of product quality often cannot be precisely recorded or collected. This study uses fuzzy numbers to construct a fuzzy estimator for Cpmk. Moreover, a testing procedure and a procedure for ranking multiple processes are provided to solve the wafer-supplier-selection problem.

Author Information

Wu, Chien-Wei
Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu, TW
Liao, Mou-Yuan
Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW
Lin, Chi-Wei
Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung, TW
Lin, Tzu-Ling
Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung, TW
Pages: 8
Price: $25.00
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Details
Stock #: JTE20150262
ISSN: 0090-3973
DOI: 10.1520/JTE20150262