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    Volume 43, Issue 6 (November 2015)

    Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors

    (Received 7 March 2014; accepted 7 July 2014)

    Published Online: 2015

    CODEN: JTEVAB

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    Abstract

    The rapid growth of the thin-film-transistor–liquid crystal-display (TFT-LCD) market has led to a highly competitive environment for TFT-LCD suppliers. Therefore, it is very important for TFT-LCD suppliers to seek high-quality technology. In this paper, we adopt the index Cpp to measure the critical quality of TFT-LCD products. However, the existent method for assessing true Cpp value assumes zero gauge measurement errors. This assumption does not reflect reality, despite the use of modern and highly sophisticated measuring instruments. Because measurement errors may result in unreliable decisions, this study proposes the concept of generalized pivotal quantities (GPQs) to construct generalized confidence intervals (GCIs) for Cpp, with consideration for measurement errors. Simulations show that the proposed method is effective for large measurement errors. Therefore, this method is reliable for a manufacturer to assess a TFT-LCD supplier's process quality. This method is also applicable to other industries.


    Author Information:

    Liao, Mou-Yuan
    Dept. of Statistics and Informatics Science, Providence Univ., Taichung,

    Wu, Chien-Wei
    Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu,

    Lin, Chien-Hua
    Dept. of Statistics and Informatics Science, Providence Univ., Taichung,


    Stock #: JTE20140103

    ISSN:0090-3973

    DOI: 10.1520/JTE20140103

    Author
    Title Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors
    Symposium ,
    Committee E11