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    Volume 43, Issue 6 (November 2015)

    An Economic Design of a Group Sampling Plan for a Weibull Distribution Using a Bayesian Approach

    (Received 3 February 2014; accepted 8 July 2014)

    Published Online: 26 November 2015

    CODEN: JTEVAB

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    Abstract

    In this paper, a cost model for a group sampling scheme is proposed for inspection of the lifetime of a product when the lifetime of the product follows a Weibull distribution. The optimal parameters of the group sampling plan are determined by minimizing the total cost and satisfying both the producer's risk and the consumer's risk simultaneously for the specified values of termination time, number of testers, and median ratio as the quality parameter. The application of the proposed plan is given in metrology for the inspection of chip products. We have conducted a comparative study, and it shows that the use of the proposed plan for testing the chips minimized the cost more than the existing acceptance sampling plan. Tables are provided, along with the total cost required for the life test.


    Author Information:

    Aslam, Muhammad
    Dept. of Statistics, Forman Christian College Univ., Lahore,

    Azam, Muhammad
    Dept. of Statistics, Forman Christian College Univ., Lahore,

    Balamurali, Saminathan
    Dept. of Mathematics, Kalasalingam Univ., Krishnankoil, TN

    Jun, Chi-Hyuck
    Dept. of Industrial and Management Engineering, POSTECH, Pohang,


    Stock #: JTE20140041

    ISSN:0090-3973

    DOI: 10.1520/JTE20140041

    Author
    Title An Economic Design of a Group Sampling Plan for a Weibull Distribution Using a Bayesian Approach
    Symposium ,
    Committee E11