(Received 13 January 2014; accepted 19 March 2014)
Published Online: 14 July 2015
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In recent years, since portable devices with thin and light designs are essential, the applications of the thin-film transistor liquid crystal display (TFT–LCD) have been applied extensively. Process yield is the most common criterion used in the TFT–LCD manufacturing industry for measuring process performance. The measurement index Spk establishes the relationship between the manufacturing specifications and the actual process performance, which provides an exact measure on process yield. In this paper, we provide two convenient ratio approaches to calculate the lower confidence bounds and critical values extensively for various values of α-risk, capability requirements, and sample sizes. Practitioners can use the proposed ratio approaches and procedures to determine whether their process meets the preset capability requirement and make reliable decisions. The convenient ratio approaches can bridge the gap between the theoretical development and factory applications for evaluation of process yields.
Pearn, W. L.
Department of Industrial Engineering and Management, National Chiao Tung Univ.,
Tai, Y. T.
Department of Information Management, Kainan Univ., Taoyuan,
Kao, C. M.
Institute of Statistics, National Chiao Tung Univ.,
Stock #: JTE20140012