You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.

    Volume 44, Issue 3 (July 2016)

    Study of Preferred Profile of Accelerated Stability Test Method for Quartz Flexible Accelerometer

    (Received 7 April 2013; accepted 17 November 2014)

    Published Online: 13 July 2016

    CODEN: JTEVAB

      Format Pages Price  
    PDF (2.4M) 11 $25   ADD TO CART

    Cite this document

    X Add email address send
    X
      .RIS For RefWorks, EndNote, ProCite, Reference Manager, Zoteo, and many others.   .DOCX For Microsoft Word



    Abstract

    Manufactured quartz flexible accelerometers have problems of poor long-term stability, which can be attributed to drifting of key parameters (e.g., zero bias, scale factor) that is influenced by a combination of time and external environmental stress inducing factors that include temperature fluctuation, thermal cycling, and dynamic mechanical loading. This paper focused on the experimental design for such a device. Accelerated stability experiments are performed and are divided into three kinds: thermal cycling test, test of concurrent application of thermal cycling and vibrational loading, and test of thermal cycling with subsequent vibrational loading. Experimental data are analyzed using the mobile linear regression coefficient test and the mobile standard deviation, after which the steady-state cycle number is determined. Based on the above analysis, the rapid effectiveness of the profiles is evaluated. Finally, the preferred profile is determined by thoroughly considering the equipment capacity and engineering operational convenience. It is illustrated that the vibrational loading has a significant effect on accelerated stability for various parameters. Overall, the research on the accelerated stability test enables an accelerometer to quickly attain a steady-state and also provides initial technical support to improve the robustness of the accelerometer's long-term stability.


    Author Information:

    Xu, Dan
    School of Reliability and Systems Engineering, Beihang Univ., Beijing,

    Chen, Yunxia
    School of Reliability and Systems Engineering, Beihang Univ., Beijing,

    Kang, Rui
    School of Reliability and Systems Engineering, Beihang Univ., Beijing,


    Stock #: JTE20130083

    ISSN:0090-3973

    DOI: 10.1520/JTE20130083

    Author
    Title Study of Preferred Profile of Accelerated Stability Test Method for Quartz Flexible Accelerometer
    Symposium ,
    Committee B01