Journal Published Online: 28 February 2014
Volume 42, Issue 3

SkSP-V Sampling Plan for the Exponentiated Weibull Distribution

CODEN: JTEVAB

Abstract

The purpose of this paper is to design an SkSP-V acceptance sampling plan for assuring percentiles based on a time-truncated life test as the reference plan when the lifetime of a product follows an exponentiated Weibull distribution. Using the non-linear optimization solution, the plan parameters are determined so as to satisfy the producer's and the consumer's risks. Tables are provided for practical use and an example is shown with a real case. Finally, the results are compared with the single sampling plan in terms of the average sample number to demonstrate the efficiency of the proposed plan.

Author Information

Aslam, Muhammad
Dept. of Statistics, Forman Christian College Univ., Lahore, PK
Rao, G.
Dept. of Statistics, Dilla Univ., Dilla, ET
Khan, Nasrullah
Dept. of Statistics, National College of Business Administration and Economics, Lahore, PK
Jun, Chi-Hyuck
Dept. of Industrial and Management Engineering, POSTECH, Pohang, KR
Pages: 9
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Details
Stock #: JTE20130051
ISSN: 0090-3973
DOI: 10.1520/JTE20130051