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    Volume 6, Issue 2 (March 1978)

    “PARS”—A Portable X-Ray Analyzer for Residual Stresses

    Published Online: 01 March 1978


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    The design, operation, and testing of a 7 to 11-kg hand-held X-ray device for measuring residual stresses are described. The instrument is based on a miniature X-ray tube and generator and a position-sensitive detector. No motion of the detector is needed to record a peak, eliminating the expensive and heavy gearing characteristic of a conventional diffractometer; the only mechanical motion during a measurement is one change of the orientation of the device to the object. An entirely portable instrument is therefore available for use in the plant or in the field. Tests are reported in which the stress is measured to ±40 MPa (± 6 ksi) or better in 4 to 20 s, depending on the specimen.

    Author Information:

    James, M
    research associate, Laboratorium voor Fysische Metaalkunde, Nijenborgh 18, Universiteitscomplex Paddepoel, University of Groningen,

    Cohen, JB
    Frank C. Engelhart professor of materials science and chairman of the Department of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, Ill.

    Stock #: JTE10925J


    DOI: 10.1520/JTE10925J

    Title “PARS”—A Portable X-Ray Analyzer for Residual Stresses
    Symposium ,
    Committee E28