Journal Published Online: 01 January 1985
Volume 13, Issue 1

An Optical Test Method for Measuring Biaxial Deformations

CODEN: JTEVAB

Abstract

A new and simple method is described for the measurement of biaxial deformation with a resolution of 0.025 μm (1 μin.). The basis for this technique is the use of an optical extensometer.

Author Information

Polvani, RS
National Bureau of Standards, Washington,DC
Reeve, CP
National Bureau of Standards, Washington,DC
Veale, RC
National Bureau of Standards, Washington,DC
Pages: 5
Price: $25.00
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Stock #: JTE10762J
ISSN: 0090-3973
DOI: 10.1520/JTE10762J