Published Online: 01 November 1980
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An interlaboratory test on room temperature measurement of unencapsulated multilayer ceramic capacitors (commonly known as chip capacitors) was conducted under the sponsorship of ASTM Committee F01 on Electronics. Results show that a well-defined method of test is needed to get agreement among mesurements of capacitance and dissipation factors for this type of capacitor.
Member of the technical staffMember of ASTM, Bell Telephone Laboratories, Inc., Allentown, Pa.
Stock #: JTE10627J