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Volume 40, Issue 4 (June 2012)
Implementation of Evaluating Process Capability Index Cpk for Processes with Multiple Characteristics
(Received 12 October 2011; accepted 6 March 2012)
Published Online: 25 June 2012
CODEN: JTEVAB
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Abstract
Process yield has been the most common criterion used in the manufacturing industry for measuring process performance. In many industrial applications, processes often have multiple characteristics with various specifications. The generated yield index CpkT establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield. In this paper, the explicated formula of the lower confidence bound is derived, and then the lower confidence bound for various values of α-risk, capability requirements, and sample sizes are calculated via the use of R programs. The lower confidence bound is essential to product reliability assurance and is important in the hypothesis testing of process capability. We not only provide some reliable lower confidence bound tables but also develop a simple and practical procedure for engineers. The practitioners can use the proposed procedure to determine whether their process meets the preset capability requirement and to make reliable decisions.
Author Information:
Pearn, W. L.
Dept. of Industrial Engineering & Management, National Chiao Tung Univ., Hsinchu,
Wu, C. H.
Dept. of Industrial Engineering & Management, National Chiao Tung Univ., Hsinchu,
Stock #: JTE104414
ISSN:0090-3973
DOI: 10.1520/JTE104414
Author
Title Implementation of Evaluating Process Capability Index Cpk for Processes with Multiple Characteristics
Symposium ,
Committee E11