Journal Published Online: 09 February 2017
Volume 6, Issue 3

Study of Scale Formation on Al O -Scale Forming Alloys by Time-of-Flight Secondary Ion Mass Spectrometry (TOF–SIMS)

CODEN: MPCACD

Abstract

Al2O3-scale formation on high temperature Ni-base and Fe-base structural alloys is a subject of significant technological and scientific interest. Such scale formation involves either (or both) inward oxygen grain boundary diffusion and new oxide growth at the scale/metal interface, or outward aluminum grain boundary diffusion and new oxide growth at the scale/gas interface. The details of scale growth have been studied using a commercial Kanthal A1 alloy and so-called double oxidation experiments—growth of an Al2O3 scale in 16O2, followed by further oxidation for twice the 16O2 duration in 18O2—at temperatures between 1000 and 1400°C. A time-of-flight secondary ion mass spectrometer (TOF-SIMS) with isotopic imaging resolution of ≈100 nm was used for determination of the 16O and 18O distributions in the scale. A focused primary Ga+ ion beam was used for imaging the oxygen isotopes in the negative polarity mode, and a de-focused Xe+ beam was used for sputtering. One novel aspect of this work was the use of taper sections to compensate for the sub-micrometer scale thickness of this oxidation-resistant alloy.

Author Information

Abbasi, K.
Swagelok Center for Surface Analysis of Materials, Case School of Engineering, Case Western Reserve Univ., Cleveland, OH, US
Zahiri, M.
Dept. of Materials Science and Engineering, Case School of Engineering, Case Western Reserve Univ., Cleveland, OH, US The Henry Samueli School of Engineering Univ. of California, Irvine, CA, US
Heuer, A.
Swagelok Center for Surface Analysis of Materials, Case School of Engineering, Case Western Reserve Univ., Cleveland, OH, US Dept. of Materials Science and Engineering, Case School of Engineering, Case Western Reserve Univ., Cleveland, OH, US
Pages: 6
Price: $25.00
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Stock #: MPC20160063
ISSN: 2165-3992
DOI: 10.1520/MPC20160063