Journal Published Online: 01 January 1999
Volume 44, Issue 1

Applications of Focused Ion Beam Systems in Gunshot Residue Investigation

CODEN: JFSCAS

Abstract

Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.

Author Information

Niewöhner, L
Forensic Science Institute of the Bundeskriminalamt, Wiesbaden, Germany
Wenz, HW
Forensic Science Institute of the Bundeskriminalamt, Wiesbaden, Germany
Pages: 5
Price: $25.00
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Details
Stock #: JFS14419J
ISSN: 0022-1198
DOI: 10.1520/JFS14419J