Journal Published Online: 01 March 1991
Volume 36, Issue 2

Use of a Silicon Carbide Sampling Accessory for the Diffuse Reflectance Infrared Fourier Transform Analysis of Samples of Interest to Forensic Science

CODEN: JFSCAS

Abstract

An infrared spectroscopy method is described which requires little sample preparation and may be used for analysis of a wide range of samples of interest to forensic science. A small quantity of a sample is rubbed onto an abrasive silicon carbide disk, which is then measured by diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS). The technique has been successfully applied to the infrared analysis of paint, synthetic rubber, cosmetics, corrector fluid, and adhesives.

Author Information

Mazzella, WD
Institut de Police Scientifique et de Criminologie, University of Lausanne, Lausanne, CH, Switzerland
Lennard, CJ
Institut de Police Scientifique et de Criminologie, University of Lausanne, Lausanne, CH, Switzerland
Pages: 9
Price: $25.00
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Stock #: JFS13058J
ISSN: 0022-1198
DOI: 10.1520/JFS13058J