Journal Published Online: 01 July 1990
Volume 35, Issue 4

Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric

CODEN: JFSCAS

Abstract

Scanning electron microscopy (SEM) micrographs were obtained for fiber ends of a nylon fabric which had been experimentally cut with a scalpel or scissors, or torn by force. In the nylon fabric used, these three types of damage were identifiable on the basis of features of the fiber ends.

Author Information

Stowell, LI
Criminalistics and Forensic and Biology Section, Chemistry Division, Department of Scientific and Industrial Research, Petone, New Zealand
Card, KA
Electron Microscopy Section, Physics and Engineering Laboratory, Department of Scientific and Industrial Research, Petone, New Zealand
Pages: 4
Price: $25.00
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Stock #: JFS12908J
ISSN: 0022-1198
DOI: 10.1520/JFS12908J