Journal Published Online: 01 July 1980
Volume 25, Issue 3

A Method for Recording X-Ray Diffraction Patterns for Trace Quantities of Crystalline Materials

CODEN: JFSCAS

Abstract

A procedure has been developed for recording diffraction patterns of small amounts of material and has been applied to the identification of silicon carbide in lubricating oil. To use this technique for the identification of material, the sample must be crystalline and the constituent of interest must be present in 1% or greater concentration.

Author Information

Foster, RL
University of Missouri, Kansas City
Howell, GR
Regional Criminalistics Laboratory, Independence, Mo
Lott, PF
University of Missouri, Kansas City
Pages: 4
Price: $25.00
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Stock #: JFS11272J
ISSN: 0022-1198
DOI: 10.1520/JFS11272J