This test method provides a procedure for measuring the electromagnetic (EM) shielding effectiveness (SE) of a planar material for a plane, far-field EM wave. From the measured data, near-field SE values may be calculated for magnetic (H) sources for electrically thin specimens.2,3 Electric (E) field SE values may also be calculated from this same far-field data, but their validity and applicability have not been established.
Keywordselectromagnetic shielding; far field; shielding; shielding effectiveness (SE)
The new standard is valid over a frequency range of 30MHz to 3GHz,which can satisfy recent needs of SE measurement.It will be used to measure of shielding effectiveness(SE)of various planar electromagnetic shielding materials.Government supervision department and testing organizations will use it to determine the quality of electromagnetic shielding materials.
The title and scope are in draft form and are under development within this ASTM Committee.Back to Top
Draft Under Development