ASTM E666 - 14 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.
D1879 Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation
E668 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E1161 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
E1819 Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities
E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
E2450 Standard Practice for Application of CaF
F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
F773M Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics
F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E170 Terminology Relating to Radiation Measurements and Dosimetry
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources