ASTM E2859 - 11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

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    E1617 Practice for Reporting Particle Size Characterization Data

    E2382 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

    E2456 Terminology Relating to Nanotechnology

    E2530 Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

    E2587 Practice for Use of Control Charts in Statistical Process Control