ASTM E2534 - 20 Standard Practice for Targeted Defect Detection Using Process Compensated Resonance Testing Via Swept Sine Input for Metallic and Non-Metallic Parts


    Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.

    E543 Standard Specification for Agencies Performing Nondestructive Testing

    E2001 Standard Guide for Resonant Ultrasound Spectroscopy for Defect Detection in Both Metallic and Non-metallic Parts

    E3081 Standard Practice for Outlier Screening Using Process Compensated Resonance Testing via Swept Sine Input for Metallic and Non-Metallic Parts

    E3166 Standard Guide for Nondestructive Examination of Metal Additively Manufactured Aerospace Parts After Build

    E3213 Standard Practice for Part-to-Itself Examination Using Process Compensated Resonance Testing Via Swept Sine Input for Metallic and Non-Metallic Parts


    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E1316 Terminology for Nondestructive Examinations

    E2001 Guide for Resonant Ultrasound Spectroscopy for Defect Detection in Both Metallic and Non-metallic Parts

    E3081 Practice for Outlier Screening Using Process Compensated Resonance Testing via Swept Sine Input for Metallic and Non-Metallic Parts

    E3213 Practice for Part-to-Itself Examination Using Process Compensated Resonance Testing Via Swept Sine Input for Metallic and Non-Metallic Parts