ASTM E1894 - 13a Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

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F526 Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines

F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

F773M Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)

F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

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Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

E170 Terminology Relating to Radiation Measurements and Dosimetry

E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation

E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources