ASTM E1854 - 13 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.
E1855 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
E2450 Standard Practice for Application of CaF
F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E170 Terminology Relating to Radiation Measurements and Dosimetry
E181 Test Methods for Detector Calibration and Analysis of Radionuclides
E261 Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
E262 Test Method for Determining Thermal Neutron Reaction Rates and Thermal Neutron Fluence Rates by Radioactivation Techniques
E263 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Iron
E264 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E393 Test Method for Measuring Reaction Rates by Analysis of Barium-140 From Fission Dosimeters
E481 Test Method for Measuring Neutron Fluence Rates by Radioactivation of Cobalt and Silver
E482 Guide for Application of Neutron Transport Methods for Reactor Vessel Surveillance, E706 (IID)
E496 Test Method for Measuring Neutron Fluence and Average Energy from 3H(d,n) 4He Neutron Generators by Radioactivation Techniques
E523 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Copper
E526 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Titanium
E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E704 Test Method for Measuring Reaction Rates by Radioactivation of Uranium-238
E705 Test Method for Measuring Reaction Rates by Radioactivation of Neptunium-237
E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E721 Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
E798 Practice for Conducting Irradiations at Accelerator-Based Neutron Sources
E844 Guide for Sensor Set Design and Irradiation for Reactor Surveillance, E 706 (IIC)
E944 Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance, E 706 (IIA)
E1018 Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)
E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
E1250 Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
E1297 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
E1855 Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
E2005 Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
E2450 Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
F980 Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F1190 Guide for Neutron Irradiation of Unbiased Electronic Components