Research Report RR:F01-1014

    An interlaboratory study was conducted by six laboratories testing nine samples to establish a precision statement for test method F996.

    Published: November 1997

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    Related Standards

    F996-11(2018) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics

    Committee F01 on Electronics

    Subcommittee F01.11 on Nuclear and Space Radiation Effects