Research Report RR:F01-1014

    An interlaboratory study was conducted by six laboratories testing nine samples to establish a precision statement for test method F996.

    Published: July 2008

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    Related Standards

    F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

    Committee F01 on Electronics

    Subcommittee F01.11 on Nuclear and Space Radiation Effects