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    Standards Related to F773M - F773M

    F744M-16

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

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    Developed By: Committee F01 on Electronics

    F526-16

    Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines

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    Developed By: Committee E10 on Nuclear Technology and Applications

    F1262M-14

    Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

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    Developed By: Committee F01 on Electronics

    E1367-03(2014)

    Standard Test Method for Measuring the Toxicity of Sediment-Associated Contaminants with Estuarine and Marine Invertebrates

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    Developed By: Committee E50 on Environmental Assessment, Risk Management and Corrective Action

    F1893-18

    Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

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    Developed By: Committee F01 on Electronics

    F448-18

    Standard Test Method for Measuring Steady-State Primary Photocurrent

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    Developed By: Committee F01 on Electronics

    F1892-12(2018)

    Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

    Also Available in these Collections:

    Developed By: Committee F01 on Electronics

    F1467-18

    Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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    Developed By: Committee F01 on Electronics

    E666-14

    Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications