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    Standards Related to E668 - E668

    E1249-15

    Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

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    Developed By: Committee E10 on Nuclear Technology and Applications

    E666-14

    Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

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    Developed By: Committee E10 on Nuclear Technology and Applications

    F1892-12

    Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

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    Developed By: Committee F01 on Electronics

    F1467-11

    Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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    Developed By: Committee F01 on Electronics

    E2304-03(2011)

    Standard Practice for Use of a LiF Photo-Fluorescent Film Dosimetry System

    Also Available in these Collections:

    Developed By: Committee E61 on Radiation Processing

    E1894-13a

    Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications

    F1893-11

    Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

    Also Available in these Collections:

    Developed By: Committee F01 on Electronics