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    Standards Related to E666 - E666

    E668-13

    Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

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    Developed By: Committee E10 on Nuclear Technology and Applications

    E2232-16

    Standard Guide for Selection and Use of Mathematical Methods for Calculating Absorbed Dose in Radiation Processing Applications

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    Developed By: Committee E61 on Radiation Processing

    F1892-12

    Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

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    Developed By: Committee F01 on Electronics

    F1467-11

    Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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    Developed By: Committee F01 on Electronics

    E1249-15

    Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

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    Developed By: Committee E10 on Nuclear Technology and Applications

    E1894-13a

    Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

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    Developed By: Committee E10 on Nuclear Technology and Applications

    F996-11

    Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

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    Developed By: Committee F01 on Electronics