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    Standards Related to E1894 - E1894

    F1467-11

    Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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    Developed By: Committee F01 on Electronics

    E1249-15

    Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

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    Developed By: Committee E10 on Nuclear Technology and Applications

    F996-11

    Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

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    Developed By: Committee F01 on Electronics

    F526-16

    Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines

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    Developed By: Committee E10 on Nuclear Technology and Applications