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      Standards Related to E1894 - E1894

      F1467-18

      Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

      Also Available in these Collections:

      • Annual Book of ASTM Standards Online: 10.04

      Developed By: Committee F01 on Electronics


      E1249-15(2021)

      Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

      Also Available in these Collections:

      • Annual Book of ASTM Standards Online: 12.02

      Developed By: Committee E10 on Nuclear Technology and Applications


      F996-11(2018)

      Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics

      Also Available in these Collections:

      • Annual Book of ASTM Standards Online: 10.04

      Developed By: Committee F01 on Electronics


      F526-16

      Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines

      Also Available in these Collections:

      • Annual Book of ASTM Standards Online: 12.02

      Developed By: Committee E10 on Nuclear Technology and Applications