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    Standards Related to E1854 - E1854

    E1855-15

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications

    F980-16

    Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

    Also Available in these Collections:

    Developed By: Committee F01 on Electronics

    E693-12e1

    Standard Practice for Characterizing Neutron Exposures in Iron and Low Alloy Steels in Terms of Displacements Per Atom (DPA)

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications

    F1190-11

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    Also Available in these Collections:

    Developed By: Committee F01 on Electronics

    E521-16

    Standard Practice for Investigating the Effects of Neutron Radiation Damage Using Charged-Particle Irradiation

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications

    E261-16

    Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques

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    Developed By: Committee E10 on Nuclear Technology and Applications

    E2005-10(2015)

    Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications

    E1035-13

    Standard Practice for Determining Neutron Exposures for Nuclear Reactor Vessel Support Structures

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications

    E900-15e1

    Standard Guide for Predicting Radiation-Induced Transition Temperature Shift in Reactor Vessel Materials

    Also Available in these Collections:

    Developed By: Committee E10 on Nuclear Technology and Applications