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    Standards Related to A388 - A388/A388M

    A745/A745M-15

    Standard Practice for Ultrasonic Examination of Austenitic Steel Forgings

    Also Available in these Collections:

    Developed By: Committee A01 on Steel, Stainless Steel and Related Alloys

    E1901-13

    Standard Guide for Detection and Evaluation of Discontinuities by Contact Pulse-Echo Straight-Beam Ultrasonic Methods

    Also Available in these Collections:

    Developed By: Committee E07 on Nondestructive Testing

    E164-13

    Standard Practice for Contact Ultrasonic Testing of Weldments

    Also Available in these Collections:

    Developed By: Committee E07 on Nondestructive Testing

    A609/A609M-12

    Standard Practice for Castings, Carbon, Low-Alloy, and Martensitic Stainless Steel, Ultrasonic Examination Thereof

    Also Available in these Collections:

    Developed By: Committee A01 on Steel, Stainless Steel and Related Alloys

    A531/A531M-13

    Standard Practice for Ultrasonic Examination of Turbine-Generator Steel Retaining Rings

    Also Available in these Collections:

    Developed By: Committee A01 on Steel, Stainless Steel and Related Alloys

    A418/A418M-15

    Standard Practice for Ultrasonic Examination of Turbine and Generator Steel Rotor Forgings

    Also Available in these Collections:

    Developed By: Committee A01 on Steel, Stainless Steel and Related Alloys

    E2375-16

    Standard Practice for Ultrasonic Testing of Wrought Products

    Also Available in these Collections:

    Developed By: Committee E07 on Nondestructive Testing

    E317-16

    Standard Practice for Evaluating Performance Characteristics of Ultrasonic Pulse-Echo Testing Instruments and Systems without the Use of Electronic Measurement Instruments

    Also Available in these Collections:

    Developed By: Committee E07 on Nondestructive Testing

    F1512-94(2011)

    Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies

    Also Available in these Collections:

    Developed By: Committee F01 on Electronics