Standard Historical Last Updated: Aug 16, 2017 Track Document
ASTM F1893-98

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices F1893-98 ASTM|F1893-98|en-US Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices Standard new BOS Vol. 10.04 Committee F01
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Scope

1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

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Details
Book of Standards Volume: 10.04
Developed by Subcommittee: F01.11
Pages: 5
DOI: 10.1520/F1893-98
ICS Code: 31.080.01