Standard Historical Last Updated: Aug 16, 2017 Track Document
ASTM F1263-99

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts F1263-99 ASTM|F1263-99|en-US Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts Standard new BOS Vol. 10.04 Committee F01
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Scope

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.

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Details
Book of Standards Volume: 10.04
Developed by Subcommittee: F01.11
Pages: 3
DOI: 10.1520/F1263-99
ICS Code: 31.020