Standard Historical Last Updated: Jul 06, 2011 Track Document
ASTM F1238-95(2003)

Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications

Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications F1238-95R03 ASTM|F1238-95R03|en-US Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications Standard new BOS Vol. 10.04 Committee F01
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Abstract

This specification covers refractory silicide sputtering targets for use in microelectronic applications. Targets shall be classified by the following major constituents: molybdenum silicide, tantalum silicide, titanium silicide, and tungsten silicide. Target composition shall be stated as the atomic ratio of silicon to metal and shall conform to the prescribed maximum impurity level for: alkalis (potassium, lithium, sodium), refractory metals (molybdenum, tantalum, titanium, and tungsten), iron, other metals (aluminum, boron, calcium, cobalt, chromium, copper, magnesium, manganese, and nickel), carbon, and oxygen. Low alpha grade targets shall contain the prescribed maximum impurity level of uranium and thorium Dimensional and physical properties such as relative, actual, and theoretical densities are specified. The actual target density shall be determined by Archimedes principle or other acceptable techniques and the theoretical density shall be calculated from the given formula. The following chemical analytical methods shall be used: atomic absorption, combustion or infrared spectrometry, inert gas fusion, and alpha-emission rate analysis, depending on the impurity to be analyzed. There shall be no radial cracks, other cracks, or chips on the sputtering surface.

Scope

1.1 This specification covers sputtering targets fabricated from metallic silicides (molybdenum silicide, tantalum silicide, titanium silicide, and tungsten silicide). These targets are referred to as refractory silicide targets, and are intended for use in microelectronic applications.

1.2 The values stated in SI units are regarded as standard.

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Details
Book of Standards Volume: 10.04
Developed by Subcommittee: F01.17
Pages: 2
DOI: 10.1520/F1238-95R03
ICS Code: 31.100