Standard Historical Last Updated: Dec 23, 2011 Track Document
ASTM E2444-05e1

Terminology Relating to Measurements Taken on Thin, Reflecting Films

Terminology Relating to Measurements Taken on Thin, Reflecting Films E2444-05E01 ASTM|E2444-05E01|en-US Terminology Relating to Measurements Taken on Thin, Reflecting Films Standard new BOS Vol. 03.01 Committee E08
$ 66.00 In stock

Scope

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

Price:
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Book of Standards Volume: 03.01
Developed by Subcommittee: E08.02
Pages: 3
DOI: 10.1520/E2444-05E01
ICS Code: 01.040.31; 31.240