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1.1 These test methods define procedures for the relative characterization of conductor material connectability on the basis of measurements of parameters important to the design and performance of electrical contacts and connections to and with such conductors for both power and signal applications.
1.2 The parameters measured are contact resistance as a function of contact force, fretting sensitivity, and compressive relaxation.
1.3 Provision is made for measurement of the connectability parameters at elevated temperature, or corrosive ambient, or both, as may be required for evaluation for particular applications.
1.4 These test methods, using standardized specimen geometry and procedures, are applicable to conductor materials as employed in an electrical connection system and may be adapted for evaluation of connectability of materials in the form of actual connection system components.
1.5 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety and health practices, and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
B539 Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
B542 Terminology Relating to Electrical Contacts and Their Use
ICS Number Code 29.050 (Superconductivity and conducting materials)
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ASTM B896-99(2005), Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials, ASTM International, West Conshohocken, PA, 2005, www.astm.orgBack to Top