SUPERSEDED (click for Active standard)
| ||Format||Pages||Price|| |
|5||$62.00||  ADD TO CART|
1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.
1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).
1.3 The minimum sample resistance required for an event detection in this standard is 10 Ω.
1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide .
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety and health practices, and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
B542 Terminology Relating to Electrical Contacts and Their Use
B854 Guide for Measuring Electrical Contact Intermittences
ICS Number Code 17.220.20 (Measurement of electrical and magnetic quantities)
UNSPSC Code 39121522(Electrical contacts); 39121461(Connector and cable seal)
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM B878-97(2014), Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors, ASTM International, West Conshohocken, PA, 2014, www.astm.orgBack to Top