ASTM B878-97(2003)

    Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

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    1. Scope

    1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.

    1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).

    1.3 The minimum sample resistance required for an event detection in this standard is 10 Ω.

    1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.

    1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

    2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    ASTM Standards

    B542 Terminology Relating to Electrical Contacts and Their Use

    B854 Guide for Measuring Electrical Contact Intermittences

    Other Standards

    EN 50 082-1:94 

    IEC 801-2 ed 2:91  Available from American National Standards Institute (ANSI), 25 W. 43rd St., 4th Floor, New York, NY 10036,

    ICS Code

    ICS Number Code 17.220.20 (Measurement of electrical and magnetic quantities)

    UNSPSC Code

    UNSPSC Code 39121522(Electrical contacts); 39121461(Connector and cable seal)

    Referencing This Standard
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    DOI: 10.1520/B0878-97R03

    Citation Format

    ASTM B878-97(2003), Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors, ASTM International, West Conshohocken, PA, 2003,

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