View Historical Standards for E2244:

Click any Designation link to view a Document Summary Description.

Document Designation and TitleYearSelect
Item(s)
E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer 05
E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer 02