Electronics Standards

    ASTM's electronics standards are instrumental in specifying, evaluating, and testing the performance requirements of the materials and accessories used in the fabrication of electronic components, devices, and equipments. These components include thin films and substrates, membrane switches, surface mount devices, electron tubes and emitters, integrated circuits, microelectronic devices, bonding wires, gas distribution system components, and flat panel displays. These electronics standards guide semiconductor device manufacturers and other companies that deal with such parts and components in the appropriate fabrication and treatment procedures, as well as in the examination and assessment of the end-products' properties to ensure quality towards safe utilization.

    List of electronics standards developed by ASTM:


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    Compound Semiconductors

    DesignationTitle
    F76 - 08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
    F1404 - 92(2007) Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique

    Contamination Control

    DesignationTitle
    F1094 - 87(2012) Standard Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method
    F1372 - 93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
    F1373 - 93(2012) Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components
    F1374 - 92(2012) Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components
    F1375 - 92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
    F1376 - 92(2012) Standard Guide for Metallurgical Analysis for Gas Distribution System Components
    F1394 - 92(2012) Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
    F1396 - 93(2012) Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components
    F1397 - 93(2012) Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components
    F1398 - 93(2012) Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components
    F1438 - 93(2012) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components

    Management Practices and Guides

    DesignationTitle
    F2577 - 14 Standard Guide for Assessment of Materials and Products for Declarable Substances
    F2725 - 11 Standard Guide for European Union's Registration, Evaluation, and Authorization of Chemicals (REACH) Supply Chain Information Exchange

    Membrane Switches

    DesignationTitle
    F1578 - 07(2014) Standard Test Method for Contact Closure Cycling of a Membrane Switch
    F1595 - 00(2012) Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
    F1596 - 07 Standard Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity
    F1598 - 95(2014) Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
    F1661 - 09 Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
    F1662 - 10 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch
    F1663 - 09 Standard Test Method for Determining the Capacitance of a Membrane Switch
    F1680 - 07a(2014) Standard Test Method for Determining Circuit Resistance of a Membrane Switch
    F1681 - 14 Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit
    F1683 - 09 Standard Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component
    F1689 - 05(2012) Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
    F1762 - 14 Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch
    F1812 - 09 Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
    F1842 - 09 Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
    F1843 - 09 Standard Practice for Sample Preparation of Transparent Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
    F1895 - 14 Standard Test Method for Submersion of a Membrane Switch
    F1896 - 10 Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
    F1995 - 13 Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch
    F1996 - 06 Standard Test Method for Silver Migration for Membrane Switch Circuitry
    F2072 - 14 Standard Test Method for Hosedown of a Membrane Switch
    F2073 - 01(2006) Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
    F2112 - 02(2011) Standard Terminology for Membrane Switches
    F2187 - 02(2011) Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
    F2188 - 02(2011) Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
    F2357 - 10 Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader
    F2359 - 04(2011) Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
    F2360 - 08 Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
    F2592 - 10 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
    F2749 - 09 Standard Test Method for Determining the Effects of Creasing a Membrane Switch or Assembly
    F2750 - 09 Standard Test Method for Determining the Effects of Bending a Membrane Switch or Assembly
    F2771 - 10 Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions
    F2865 - 13 Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch
    F2866 - 11 Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
    F2964 - 12 Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device

    Metallic Materials

    DesignationTitle
    F7 - 95(2011) Standard Specification for Aluminum Oxide Powder
    F15 - 04(2013) Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
    F16 - 12 Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
    F18 - 12 Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
    F19 - 11 Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals
    F29 - 97(2012) Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
    F30 - 96(2012) Standard Specification for Iron-Nickel Sealing Alloys
    F31 - 12 Standard Specification for Nickel-Chromium-Iron Sealing Alloys
    F44 - 95(2011) Standard Specification for Metallized Surfaces on Ceramic
    F73 - 96(2013) Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps
    F83 - 71(2013) Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
    F85 - 76(2013) Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
    F96 - 77(2010) Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms
    F106 - 12 Standard Specification for Brazing Filler Metals for Electron Devices
    F180 - 94(2010)e1 Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices
    F204 - 76(2013) Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire
    F205 - 94(2010)e1 Standard Test Method for Measuring Diameter of Fine Wire by Weighing
    F219 - 96(2013) Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
    F256 - 05(2010) Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium
    F269 - 60(2014) Standard Test Method for Sag of Tungsten Wire
    F288 - 96(2014) Standard Specification for Tungsten Wire for Electron Devices and Lamps
    F289 - 96(2014) Standard Specification for Molybdenum Wire and Rod for Electronic Applications
    F290 - 94(2010) Standard Specification for Round Wire for Winding Electron Tube Grid Laterals
    F364 - 96(2014) Standard Specification for Molybdenum Flattened Wire for Electron Tubes?
    F375 - 89(2010) Standard Specification for Integrated Circuit Lead Frame Material
    F1466 - 99(2010) Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications
    F1684 - 06(2011) Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications

    Nuclear and Space Radiation Effects

    DesignationTitle
    F448 - 11 Test Method for Measuring Steady-State Primary Photocurrent
    F615M - 95(2013) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
    F744M - 10 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
    F773M - 10 Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
    F980 - 10 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
    F996 - 11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
    F1190 - 11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
    F1192 - 11 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
    F1262M - 14 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
    F1263 - 11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
    F1467 - 11 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
    F1892 - 12 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
    F1893 - 11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

    Sputter Metallization

    DesignationTitle
    F390 - 11 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
    F1238 - 95(2011) Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
    F1367 - 98(2011) Standard Specification for Chromium Sputtering Targets for Thin Film Applications
    F1512 - 94(2011) Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies
    F1513 - 99(2011) Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
    F1593 - 08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
    F1594 - 95(2011) Standard Specification for Pure Aluminum (Unalloyed) Source Material for Vacuum Coating Applications
    F1709 - 97(2008) Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
    F1710 - 08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
    F1711 - 96(2008) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
    F1761 - 00(2011) Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets
    F1844 - 97(2008) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
    F1845 - 08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
    F1894 - 98(2011) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
    F2113 - 01(2011) Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
    F2405 - 04(2011) Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer

    Task Group on SVHCs

    DesignationTitle
    F2931 - 14 Standard Guide for Analytical Testing of Substances of Very High Concern in Materials and Products

    Terminology

    DesignationTitle
    F2576 - 13 Standard Terminology Relating to Declarable Substances in Materials

    Test Methods

    DesignationTitle
    F2617 - 08e1 Standard Test Method for Identification and Quantification of Chromium, Bromine, Cadmium, Mercury, and Lead in Polymeric Material Using Energy Dispersive X-ray Spectrometry
    F2853 - 10e1 Standard Test Method for Determination of Lead in Paint Layers and Similar Coatings or in Substrates and Homogenous Materials by Energy Dispersive X-Ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams
    F2980 - 13 Standard Test Method for Analysis of Heavy Metals in Glass by Field Portable X-Ray Fluorescence (XRF)

    Wire Bonding, Flip Chip, and Tape Automated Bonding

    DesignationTitle
    F72 - 06 Standard Specification for Gold Wire for Semiconductor Lead Bonding
    F458 - 13 Standard Practice for Nondestructive Pull Testing of Wire Bonds1,2
    F459 - 13 Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
    F487 - 13 Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding
    F584 - 06e1 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
    F1269 - 13 Standard Test Methods for Destructive Shear Testing of Ball Bonds

    Other standards developed by ASTM committees:


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