ASTM F947-85(1996)

    Standard Test Method for Determining Low-Level X-Radiation Sensitivity of Photographic Films (Withdrawn 2005)

    Withdrawn Standard: ASTM F947-85(1996) | Developed by Subcommittee: F12.60

    WITHDRAWN, NO REPLACEMENT


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    Withdrawn Rationale:

    This test method determines the maximum x-ray sensitivity coefficient (slope of diffuse visual density versus x-ray exposure) of film/processing combinations for low quantities of x-ray exposure to silver halide photographic film. This coefficient can be used to assess the relative susceptibility of films to damage from x-ray exposure, such as that encountered in airport and similar security screening systems.

    Formerly under the jurisdiction of Committee F12 on Security Systems and Equipment, this test method was withdrawn in January 2005 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

    1. Scope

    1.1 This test method is for determining the maximum x-ray sensitivity coefficient (slope of diffuse visual density versus x-ray exposure) of film/processing combinations for low quantities of x-ray exposure to silver halide photographic film. This coefficient can be used to assess the relative susceptibility of films to damage from x-ray exposure, such as that encountered in airport and similar security screening systems.

    1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.



    DOI: 10.1520/F0947-85R96

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