1.1 These test methods cover procedures for determining the gross camber of ceramic substrates in a free (nonclamped) state and for appraising the quality of a substrate lot by relating the deviation from flatness of faces due to curvature.
1.2 These test methods are applicable to substrates of sizes ranging up to 4 in. (102 mm) in the maximum dimension.
1.3 In principle, these test methods may be applied to larger dimensioned substrates.
1.4 The values stated in inch-pound units are to be regarded as the standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Ceramic materials-electrical/electronic devices; Film-electrical conductors; Gross-camber; Substrates-surface topography; Surface analysis-electronic components/devices;
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Citing ASTM Standards
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